Title of article
Structural characterization of porous film materials and the supported metal catalysts by synchrotron powder X-ray diffraction
Author/Authors
Hwo-Shuenn Sheu، نويسنده , , Pang-Hung Liu، نويسنده , , Hsin-Ling Cheng، نويسنده , , Kuei-Jung Chao، نويسنده , , Yen-Po Chang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
55
To page
61
Abstract
Synchrotron powder X-ray diffraction (PXRD) was applied to the structural characterization of microporous and mesoporous materials as well as their supported metal catalysts. Advantages of synchrotron X-ray powder diffraction are illustrated by the detection of the MFI crystalline phase on the non-smooth surface of a microporous MFI film supported on the inner wall of a ceramic hollow tube, and of the formation of Au and Pt nano-particles in powdery mesoporous materials.
Keywords
Porous materials , Nano metal particles , Synchrotron PXRD
Journal title
CATALYSIS TODAY
Serial Year
2004
Journal title
CATALYSIS TODAY
Record number
1232227
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