Author/Authors :
E.V. Savchenko، نويسنده , , G.B. Gumenchuk، نويسنده , , E.M. Yurtaeva، نويسنده , , A.G. Belov، نويسنده , , I.V. Khyzhniy، نويسنده , , M. Frankowski، نويسنده , , M.K. Beyer، نويسنده , , A.M. Smith-Gicklhorn، نويسنده , , A.N. Ponomaryov، نويسنده , , V.E. Bondybey، نويسنده ,
Abstract :
The role for the exciton-induced defects in the stimulation of anomalous low-temperature desorption of the own lattice atoms from solid Ar and Ne preirradiated by an electron beam is studied. The free electrons from shallow traps—structural defects—was monitored by the measurements of a yield of the thermally induced exoelectron emission (TSEE). The reaction of recombination of self-trapped holes with electrons is considered as a source of energy needed for the desorption of atoms from the surface of preirradiated solids. A key part of the exciton-induced defects in the phenomenon observed is demonstrated.
Keywords :
Radiation effects , Exciton-induced defects , Activation spectroscopy , Desorption , Charge carriers , Electronic relaxation
