Title of article :
Ultra-wideband spectral analysis using S2 technology
Author/Authors :
T. R. Krishna Mohan، نويسنده , , T. Chang، نويسنده , , M. Tian، نويسنده , , S. Bekker، نويسنده , , A. Olson، نويسنده , , C. Ostrander، نويسنده , , A. Khallaayoun، نويسنده , , C. Dollinger، نويسنده , , W.R. Babbitt، نويسنده , , Z. Cole، نويسنده , , R.R Reibel، نويسنده , , K.D. Merkel، نويسنده , , Y. Sun، نويسنده , , R. Cone، نويسنده , , F. Schlottau، نويسنده , , K.H. Wagner، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
13
From page :
116
To page :
128
Abstract :
This paper outlines the efforts to develop an ultra-wideband spectrum analyzer that takes advantage of the broad spectral response and fine spectral resolution (∼25 kHz) of spatial-spectral (S2) materials. The S2 material can process the full spectrum of broadband microwave transmissions, with adjustable time apertures (down to 100 μs) and fast update rates (up to 1 kHz). A cryogenically cooled Tm:YAG crystal that operates on microwave signals modulated onto a stabilized optical carrier at 793 nm is used as the core for the spectrum analyzer. Efforts to develop novel component technologies that enhance the performance of the system and meet the application requirements are discussed, including an end-to-end device model for parameter optimization. We discuss the characterization of new ultra-wide bandwidth S2 materials. Detection and post-processing module development including the implementation of a novel spectral recovery algorithm using field programmable gate array technology (FPGA) is also discussed.
Keywords :
Spatial spectral holography , Spectral recovery , Hole burning , spectrum analysis
Journal title :
Journal of Luminescence
Serial Year :
2007
Journal title :
Journal of Luminescence
Record number :
1263086
Link To Document :
بازگشت