Title of article :
Luminescence behavior and compensation effect of N-doped ZnO films deposited by rf magnetron sputtering under various gas-flow ratios of O2/N2
Author/Authors :
Wei-Min Cho، نويسنده , , Yow-Jon Lin، نويسنده , , Chia-Jyi Liu، نويسنده , , Liang-Ru Chen، نويسنده , , Yu-Tai Shih، نويسنده , , Perry Chen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
4
From page :
884
To page :
887
Abstract :
The photoluminescent and electrical properties of N-doped ZnO films fabricated by rf magnetron sputtering under various gas-flow ratios of O2/N2 were examined in this study. The dependence of conduction type on the gas-flow rate of O2/N2 was found. The authors identified a direct correlation between the defect spectral feature and conduction type of N-doped ZnO samples and provided a physical model for producing p-type ZnO. According to these observed results, the authors suggested that p-type conversion of N-doped ZnO may be due to a combined effect of the increased acceptor (substitutional nitrogen in oxygen site, zinc vacancy and interstitial oxygen) density and the decreased donor (oxygen vacancy) density. In addition, synthesis of p-type N-doped ZnO was repeated, suggesting that p-type ZnO can be fabricated with excellent reproducibility by rf magnetron sputtering a ZnO target doped with nitrogen.
Keywords :
DEFECT , Conductivity , Raman scattering , Photoluminescence , ZNO
Journal title :
Journal of Luminescence
Serial Year :
2014
Journal title :
Journal of Luminescence
Record number :
1263481
Link To Document :
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