Title of article :
Maize Starch Yield Calibrations with Near Infrared Reflectance
Author/Authors :
Marvin R. Paulsen، نويسنده , , Lester O. Pordesimo، نويسنده , , Mukti Singh، نويسنده , , Steven W. Mbuvi، نويسنده , , Binying Ye، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
455
To page :
460
Abstract :
Maize starch yield is affected by variety, environmental growing conditions, and drying conditions. One-hundred gram starch yield tests that predict actual wet milling starch yield were used as a reference method for developing an extractable starch calibration on a NIRSystems Model 6500 spectrophotometer. A maize starch yield calibration was developed from 940 samples and used to predict a validation set of 304 samples. It had a standard error of prediction (SEP) of 1·06, a coefficient of determination r2 of 0·77 and a ratio of performance to deviations (rpd) of 2·1. This indicates about 95% of similar samples could have starch yield predicted by near-infrared reflectance within about±2·1%. The calibration should be successful in segregating maize lots for high and low starch yield percentages.
Journal title :
Biosystems Engineering
Serial Year :
2003
Journal title :
Biosystems Engineering
Record number :
1266092
Link To Document :
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