Preparation and characterization of indium-doped tin oxide thin films

Highly transparent and semiconducting indium-doped tin oxide films were prepared by spray pyrolysis. These films were characterized by X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy and optical transmission. X-ray diffraction studies have shown the polycrystalline nature of the films. The preferential orientations as well as the electro-optical properties are sensitive to indium doping. The structural, electrical and optical studies carried out on these films reveal their columnar and compact structure.