• Title of article

    Electrical and microwave dielectric properties of K2Nb8O21 microwires

  • Author/Authors

    C.Y. Xu، نويسنده , , L. Zhen، نويسنده , , J.T. Jiang، نويسنده , , C.S. Lao، نويسنده , , L. Yang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    5
  • From page
    3021
  • To page
    3025
  • Abstract
    K2Nb8O21 microwires with diameters of several hundred nanometers and lengths up to tens of microns were prepared by molten salt synthesis, and characterized by X-ray diffraction, scanning electron microscopy and transmission electron microscopy. The as-synthesized microwires have semiconductor characteristics with band gap Eg of about 3.1 eV, consistent with electrical transport measurement of single microwire, which gives a resistivity of about 0.46 Ω m at room temperature. Microwave dielectric property measurement at 2–18 GHz shows that K2Nb8O21 microwires have a relative low complex permittivity. A weak dielectric relaxation occurs in the 12–16 GHz band due to the free charges polarization on the interfaces between K2Nb8O21 microwires and the PVB matrix.
  • Keywords
    Electrical transport property , microwave dielectric property , K2Nb8O21 microwires , Molten salt synthesis (MSS)
  • Journal title
    Ceramics International
  • Serial Year
    2009
  • Journal title
    Ceramics International
  • Record number

    1271877