Microwave dielectric properties and microstructures of Nd(Mg0.5Sn0.5−xTix)O3 ceramics

This study elucidates the microwave dielectric properties and microstructures of Nd(Mg0.5Sn0.5−xTix)O3 ceramics with a view to their potential for microwave devices. The Nd(Mg0.5Sn0.5−xTix)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg0.5Sn0.4Ti0.1)O3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant (ɛr) of 21.1, a quality factor (Q × f) of 50,000 GHz, and a temperature coefficient of resonant frequency (τf) of −60 ppm/°C were obtained for Nd(Mg0.5Sn0.4Ti0.1)O3 ceramics that were sintered at 1550 °C for 4 h.