Title of article :
Electrical properties of niobium doped Bi4Ti3O12-SrBi4Ti4O15 intergrowth ferroelectrics
Author/Authors :
Geetanjali Parida، نويسنده , , J. Bera، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
6
From page :
3139
To page :
3144
Abstract :
Nb-doped Bi4Ti3O12-SrBi4Ti4O15 intergrowth ceramics have been prepared by modified oxalate route. XRD phase analysis confirmed the formation of single phase compound. Nb-doping does not affect the basic crystal structure of the intergrowth. SEM micrographs showed that the grain size of the ceramics decreases with Nb-doping. The temperature dependence of dielectric constant and losses was investigated in the temperature range 30–800 °C and frequency range 1 kHz–1 MHz. With Nb-doping, the Tc of the ferroelectrics reduces and peak permittivity increases. Doping also introduces small relaxor behavior in the ferroelectrics. The dc conductivity of the ceramics decreases with doping. The remnant polarization (Pr) of the intergrowth ferroelectrics is increased with Nb doping.
Keywords :
B. Defects , B. X-ray methods , C. Electrical properties , C. Ferroelectric properties
Journal title :
Ceramics International
Serial Year :
2014
Journal title :
Ceramics International
Record number :
1275866
Link To Document :
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