Author/Authors :
N.L. Tarwal، نويسنده , , K.V. Gurav b، نويسنده , , S.H. Mujawar، نويسنده , , S.B. Sadale، نويسنده , , K.W. Nam، نويسنده , , W.R. Bae، نويسنده , , A.V. Moholkar a، نويسنده , , J.H. Kim، نويسنده , , P.S. Patil، نويسنده , , J.H. Jang، نويسنده ,
Abstract :
Copper incorporated zinc oxide (Cusingle bondZnO) thin films were synthesized onto the glass and tin doped indium oxide (ITO) coated glass substrates at 450 °C by simple and cost-effective spray pyrolysis technique (SPT). The X-ray diffraction (XRD) patterns confirmed the polycrystalline nature of the films having hexagonal crystal structure. A compact and granular morphology was observed for all deposited films. The absorption edge of the Cusingle bondZnO films showed a red shift, meaning that the optical band gap energy decreases as copper doping concentration increases. The room-temperature photoluminescence (PL) spectra of Cusingle bondZnO films revealed the ultraviolet (UV) near band edge emission peak at ~373 nm and the defect related level emission at ~447 nm. Furthermore, films deposited onto conducting ITO coated glass substrates were tested for their photoelectrochemical (PEC) performance in 0.5 M Na2SO4 electrolyte solution. The fill factor (FF) and open circuit voltage (Voc) values were improved for Cusingle bondZnO films.
Keywords :
SEM , Photoluminescence , Photoelectrochemical properties , Zinc oxide thin films , XRD