Title of article
Temperature dependent structural and dielectric investigations of PbZr0.5Ti0.5O3 solid solution at the morphotropic phase boundary
Author/Authors
Geetika Srivastava، نويسنده , , Ankur Goswami، نويسنده , , A.M. Umarji، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
7
From page
1977
To page
1983
Abstract
PbZr1−xTixO3 ceramics synthesised by low temperature calcination followed by sintering at 1280 °C show a Morphotropic Phase Boundary (MPB) for compositions of x=0.44–0.51. The morphotropic phase boundary is wider for samples with smaller grain sizes due to the synthesis route. A Rietveld analysis is performed on a composition of x=0.5 composition to quantify the phase fractions of the tetragonal and monoclinic phases present in the PZT system. Temperature dependent X-ray diffraction and dielectric studies of PbZr0.5Ti0.5O3 composition demonstrated a phase transformation from monoclinic to tetragonal at 270 °C followed by a ferroelectric tetragonal to a paraelectric cubic transition at 370 °C. Thus, the poling of these ceramics should be performed below 270 °C to benefit from the presence of a monoclinic phase.
Keywords
A. Sintering , B. Grain size , D. PZT , C. Dielectric properties
Journal title
Ceramics International
Serial Year
2013
Journal title
Ceramics International
Record number
1277323
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