Title of article
Avoidance of stiction in the release of highly boron doped micro-actuators fabricated using BESOI substrates
Author/Authors
Rosa، M.A. نويسنده , , Dimitrijev، S. نويسنده , , Harrison، H.B. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-138
From page
139
To page
0
Abstract
This paper presents a new technique which has been successfully applied to the fabrication of micromachined components to avoid the ʹdevice stictionʹ often encountered during the final processing steps of micro-fabrication. Based on the use of BESOI substrates, this technique involves the heavy boron doping of the final processed structure, followed by a timed wet etch which releases the micromachined device by controllably lowering the undoped Si substrate beneath it.
Keywords
Thermal benchmark IC , Dynamic thermal modeling of IC packages , Measuring of thermal coupling in ICs
Journal title
MICROELECTRONICS RELIABILITY
Serial Year
1999
Journal title
MICROELECTRONICS RELIABILITY
Record number
12856
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