• Title of article

    Avoidance of stiction in the release of highly boron doped micro-actuators fabricated using BESOI substrates

  • Author/Authors

    Rosa، M.A. نويسنده , , Dimitrijev، S. نويسنده , , Harrison، H.B. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -138
  • From page
    139
  • To page
    0
  • Abstract
    This paper presents a new technique which has been successfully applied to the fabrication of micromachined components to avoid the ʹdevice stictionʹ often encountered during the final processing steps of micro-fabrication. Based on the use of BESOI substrates, this technique involves the heavy boron doping of the final processed structure, followed by a timed wet etch which releases the micromachined device by controllably lowering the undoped Si substrate beneath it.
  • Keywords
    Thermal benchmark IC , Dynamic thermal modeling of IC packages , Measuring of thermal coupling in ICs
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Serial Year
    1999
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Record number

    12856