Title of article :
A model of l/f noise spectrum generation in granular structures
Author/Authors :
Takagi، Keiji نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
-540
From page :
541
To page :
0
Abstract :
A fluctuating spectrum was calculated and a Lorentzian type spectrum obtained, in a contacting spot between the tapered grain boundaries and l/f type spectrum on the granular structure in low frequency. This is based on the spontaneous temperature fluctuation of the small conducting spots between the grains and thermal conduction in the granular structures. © 1999 Elsevier Science Ltd. All rights reserved.
Keywords :
Microstructural analysis , Electromigration , Aluminum alloys , Resistance measurements
Journal title :
MICROELECTRONICS RELIABILITY
Serial Year :
1999
Journal title :
MICROELECTRONICS RELIABILITY
Record number :
12954
Link To Document :
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