Title of article :
Preparations and characterizations of nanostructured TiO2 and TiO2–Si(Ti)O2 composite systems Original Research Article
Author/Authors :
R.N. Viswanath، نويسنده , , A. Chandra Bose، نويسنده , , S. Ramasamy، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
8
From page :
1991
To page :
1998
Abstract :
Nanocrystalline TiO2 and TiO2–SiO2 composites have been prepared by sol-gel route. The samples are consolidated and sintered to get nanostructured TiO2 and nanostructured TiO2–SiO2 composites. In the TiO2–SiO2 system, the TiO2 nanograins are dispersed in the Si(Ti)O2 matrix. The experimental techniques namely powder X-ray Diffraction (XRD), Transmission Electron Microscopy (TEM) and Energy Dispersive Analysis of X-ray (EDAX) have been used to determine the crystal structure and compositions. Impedance measurements are made for the samples in the frequency range between 10 Hz and 10 MHz in oxygen atmosphere at various temperatures between 500 and 950°C. The results show that the impedance developed independently from the regions of grain and grain boundary. With the increase in temperature the impedance spectrum becomes smooth having lower d.c. resistance compared to the values for lower temperatures. The conductivity of the grain boundary is found to be dominant compared to that of the grain. The glass like Si(Ti)O2 insulating structure in between the TiO2 nanograins seems to control the transport properties of the system.
Keywords :
B. Sol-gel growth , A. Nanostructures , C. X-ray diffraction
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2001
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1307704
Link To Document :
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