Title of article :
Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data
Original Research Article
Author/Authors :
V.A Streltsov، نويسنده , , P.N.H. Nakashima، نويسنده , , A.W.S Johnson، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
To accurately measure the low order structure factors of α-Al2O3, two-dimensional convergent beam electron diffraction (CBED) data from parallel-sided platelets at various accelerating voltages, thickness and orientations have been matched using the Bloch-wave method. Middle and high angle extinction-free data has been obtained by the extrapolation of multi-wavelength synchrotron X-ray measurements to zero wavelength. The combination of high-energy synchrotron X-ray diffraction and CBED allows the extinction-free absolute-scale measurements and improves the reliability of the electron charge density maps in α-Al2O3.
Keywords :
X-ray diffraction
Journal title :
Journal of Physics and Chemistry of Solids
Journal title :
Journal of Physics and Chemistry of Solids