Vibrational spectroscopic studies on Ba0.8Sr0.2TiO3 thin films prepared by RF sputtering technique Original Research Article

Thin films of Ba0.8Sr0.2TiO3 have been deposited on p-type Si substrate by radio frequency magnetron sputtering. Polycrystalline bulk Ba0.8Sr0.2TiO3 sample has also been studied for comparison. X-ray diffraction patterns reveal that both the bulk sample and thin films are polycrystalline without any preferential orientation and belong to paraelectric cubic phase. We have compared the room temperature Raman and IR spectra of powder and thin films (both annealed and as-deposited) of Ba0.8Sr0.2TiO3. The extra feature in the Raman spectrum for the annealed film has been explained as due to the presence of intergrain stresses from the submicron size grains in it.