Title of article :
Structural and optical characterization of Sb-doped CuInS2 thin films grown by vacuum evaporation method
Original Research Article
Author/Authors :
Y. Akaki، نويسنده , , H. Komaki، نويسنده , , H. Yokoyama، نويسنده , , K. Yoshino، نويسنده , , K. Maeda، نويسنده , , T. Ikari، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Structural, electrical and optical properties of Sb-doped CuInS2 thin films grown by single source thermal evaporation method were studied. The films were annealed from 100 to 500 °C in air after the evaporation. The X-ray diffraction spectra indicated that polycrystalline CuInS2 films were successfully obtained by annealing above 200 °C. This temperature was lower than that of non-doped CuInS2 films. Furthermore, We found that the Sb-doped CuInS2 thin films became close to stoichiometry in comparison with non-doped CuInS2 thin films. The Sb-doped samples annealed above 200 °C has bandgap energy of 1.43–1.50 eV.
Keywords :
C. X-ray diffraction
Journal title :
Journal of Physics and Chemistry of Solids
Journal title :
Journal of Physics and Chemistry of Solids