Title of article
Electrochemical characteristics of alumina dielectric layers Original Research Article
Author/Authors
Han-Jun Oh، نويسنده , , Yongsoo Jeong، نويسنده , , Su-Jung Suh، نويسنده , , Young Jik Kim and In Hag Choi، نويسنده , , Choong-Soo Chi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
7
From page
2219
To page
2225
Abstract
The electrochemical characteristics of alumina dielectric layers were studied using a surface roughness factor and an impedance spectroscopy. From the limiting diffusion current method, the surface area factor of the dielectric anodic layer with low electrical conductivity was estimated to be 1.03. As alumina dielectric films on Al have a variable stoichiometry, the electrochemical behavior of Al2O3 layer can be monitored by evaluating an equivalent circuit with Young impedance of dielectric constant with a vertical decay of conductivity.
Keywords
Transmission electron microscopy , Electrochemical impedance spectroscopy , Electrolytic capacitor , Aluminum oxide , Rutherford backscattering spectrometry
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2003
Journal title
Journal of Physics and Chemistry of Solids
Record number
1308446
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