• Title of article

    Electrochemical characteristics of alumina dielectric layers Original Research Article

  • Author/Authors

    Han-Jun Oh، نويسنده , , Yongsoo Jeong، نويسنده , , Su-Jung Suh، نويسنده , , Young Jik Kim and In Hag Choi، نويسنده , , Choong-Soo Chi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    7
  • From page
    2219
  • To page
    2225
  • Abstract
    The electrochemical characteristics of alumina dielectric layers were studied using a surface roughness factor and an impedance spectroscopy. From the limiting diffusion current method, the surface area factor of the dielectric anodic layer with low electrical conductivity was estimated to be 1.03. As alumina dielectric films on Al have a variable stoichiometry, the electrochemical behavior of Al2O3 layer can be monitored by evaluating an equivalent circuit with Young impedance of dielectric constant with a vertical decay of conductivity.
  • Keywords
    Transmission electron microscopy , Electrochemical impedance spectroscopy , Electrolytic capacitor , Aluminum oxide , Rutherford backscattering spectrometry
  • Journal title
    Journal of Physics and Chemistry of Solids
  • Serial Year
    2003
  • Journal title
    Journal of Physics and Chemistry of Solids
  • Record number

    1308446