Title of article
Evaluation of P-HEMT MMIC technology PH25 for space applications
Author/Authors
Huguet، P. نويسنده , , Auxemery، P. نويسنده , , Pataut، G. نويسنده , , Garat، F. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-1048
From page
1049
To page
0
Abstract
The evaluation of the P-HEMT technology PH25 according to the European Space Agency requirements is presented. The reliability assessment plan features high temperature storage tests, DC life-tests and RF life-tests, performed on a set of evaluation test vehicles specifically defined for this purpose. The results of these tests evidence a temperature activated wear-out mechanism, a very low sensitivity of PH25 on strong RF stress and no sensitivity on hydrogen. Failure rates calculations are in line with the space programme requirements. © 1999 Elsevier Science Ltd, All rights reserved.
Keywords
Electromigration , Microstructural analysis , Resistance measurements , Aluminum alloys
Journal title
MICROELECTRONICS RELIABILITY
Serial Year
1999
Journal title
MICROELECTRONICS RELIABILITY
Record number
13086
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