Title of article
Advances in crystal analyzers for inelastic X-ray scattering Original Research Article
Author/Authors
C. Masciovecchio and R. Verbeni، نويسنده , , M. Kocsis، نويسنده , , S. Huotari، نويسنده , , M. Krisch، نويسنده , , G. Monaco and G. Panaccione، نويسنده , , F. Sette، نويسنده , , G. Vanko، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
7
From page
2299
To page
2305
Abstract
The realization of spherical crystal analyzers for inelastic X-ray scattering experiments (IXS) is an ongoing project at the ESRF since 1992. We developed reliable techniques to routinely produce silicon spherical analyzers with very high (ΔE=1÷10 meV) and high energy resolution (ΔE=0.2÷1.5 eV), and with very good focal properties and efficiency. In this article we report the state of the art of the analyzer construction and the main improvements made during the last years.
Keywords
C X-ray diffraction
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2005
Journal title
Journal of Physics and Chemistry of Solids
Record number
1309233
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