Title of article
Trap state spectroscopy in CMR manganites and spinel manganates using opto-impedance Original Research Article
Author/Authors
K. Ragavendran، نويسنده , , V. Morchshakov، نويسنده , , A. Veluchamy، نويسنده , , Klaus B?rner، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
182
To page
186
Abstract
The photo-induced AC-impedance method is used as a versatile instrumentation to study the trap state densities and the carrier relaxation times in magneto-resistive manganites and magneto-conductive manganates and thus as a probe to check the crystal quality, which is important for the performance of any device material. A comparative study using compounds of different defect densities is presented. High defect concentrations in the compounds are identified through the photoresistivity and/or the photo-induced capacitive build up.
Keywords
A. Semiconductors , D. Transport properties
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2008
Journal title
Journal of Physics and Chemistry of Solids
Record number
1310010
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