Title of article :
Electrical and optical properties of TiO2-doped ZnO films prepared by radio-frequency magnetron sputtering Original Research Article
Author/Authors :
Jeng-Lin Chung، نويسنده , , Jyh-Chen Chen، نويسنده , , Chung-Jen Tseng، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
535
To page :
539
Abstract :
TiO2-doped zinc oxide (ZnO) films were prepared by radio frequency (RF) magnetron sputtering in argon gas. The electrical and optical properties in the TiO2-doped ZnO films as functions of the TiO2 content were investigated. It was observed that the (0 0 2) preferred orientation had a significant value of 34–35° for a Ti content of 0.71, 1.38, and 1.97 at%. When the Ti content of the TiO2-doped ZnO films was above 2.81 at%, the films became amorphous. The 1.38 at% TiO2-doped ZnO films had the lowest resistivity: 9.02×10−3 Ω cm. All of the TiO2-doped ZnO films had 85% transmittance in the visible wavelength range. The optical energy band gap increased from 3.33 eV for 0.71 at% Ti to 3.43 eV for 3.43 at% Ti.
Keywords :
A. Semiconductors , A. Thin films , D. Electrical properties
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2008
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1310080
Link To Document :
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