Polarization dependence of resonant inelastic X-ray scattering spectroscopy in correlated electron systems Original Research Article

Resonant inelastic X-ray scattering (RIXS) at the transition-metal K-edge is studied as a tool to detect the electronic structure in correlated electron systems. We, in particular, focus on the polarization dependence of RIXS intensity and symmetry of the electronic excitations. It is shown that by analyzing the polarization of the initial and scattered X-rays, the symmetry of the 4p4p orbitals are selected. Combined effects of the polarization of X-rays and the momentum transfer in the scattering are also studied.