Author/Authors :
Jinyuan Yan، نويسنده , , Jason Knight، نويسنده , , Martin Kunz، نويسنده , , Selva Vennila Raju، نويسنده , , Bin Chen، نويسنده , , Arianna E. Gleason، نويسنده , , Budhiram K. Godwal، نويسنده , , Zack Geballe، نويسنده , , Raymond Jeanloz، نويسنده , , Simon M. Clark، نويسنده ,
Abstract :
X-ray diffraction from LaB6 standards document a precision of 478 ppm in lattice-parameter determinations for beamline 12.2.2 at Lawrence Berkeley National Laboratory′s Advanced Light Source, a facility for characterizing materials at high pressures and temperatures using laser- and resistance-heated diamond cells. Melting of Ni, Mo, Pt and W, resistively heated at 1 atm pressure in Ar, provides a validation of the beamline spectroradiometric system that is used to determine sample temperatures. The known melting temperatures, which range from 1665 to 3860 K for these metals, are all reproduced to within ±80 K.
