Title of article :
MxTiSe2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy Original Research Article
Author/Authors :
A.S. Shkvarin، نويسنده , , Yu.M. Yarmoshenko، نويسنده , , M.V. Yablonskikh، نويسنده , , N.A. Skorikov، نويسنده , , A.I. Merentsov، نويسنده , , M.V. Kuznetsov، نويسنده , , A.N. Titov، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
4
From page :
1562
To page :
1565
Abstract :
Intercalation of Cu and Mn between the layers of TiSe2 leads to the charge transfer from the doped atom to Ti atoms, electronic states of which form the conduction band of TiSe2. This situation drastically differs from another one being observed during intercalation of other transition metals into TiSe2 that leads to the formation of covalent complexes consisting of intercalated atom and nearest neighborhood of the host lattice. Substitution of Ti by Cr in the host lattice positions does not show both charge transfer nor formation of covalent complexes.
Keywords :
C. Photoelectron spectroscopy , D. Electronic structure
Journal title :
Journal of Physics and Chemistry of Solids
Serial Year :
2012
Journal title :
Journal of Physics and Chemistry of Solids
Record number :
1311793
Link To Document :
بازگشت