Title of article :
Neural network metamodeling for cycle time-throughput profiles in manufacturing
Author/Authors :
Feng Yang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Abstract :
This paper proposed a neural network (NN) metamodeling method to generate the cycle time (CT)–throughput (TH) profiles for single/multi-product manufacturing environments. Such CT–TH profiles illustrate the trade-off relationship between CT and TH, the two critical performance measures, and hence provide a comprehensive performance evaluation of a manufacturing system. The proposed methods distinct from the existing NN metamodeling work in three major aspects: First, instead of treating an NN as a black box, the geometry of NN is examined and utilized; second, a progressive model-fitting strategy is developed to obtain the simplest-structured NN that is adequate to capture the CT–TH relationship; third, an experiment design method, particularly suitable to NN modeling, is developed to sequentially collect simulation data for the efficient estimation of the NN models.
Keywords :
semiconductor manufacturing , Queueing , Discrete event simulation , Neural networks , Response surface modeling , Design of Experiments
Journal title :
European Journal of Operational Research
Journal title :
European Journal of Operational Research