Title of article :
Research note Analog circuit fault diagnosis based on noise measurement
Author/Authors :
Dai، Yisong نويسنده , , Xu، Jiansheng نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
-1292
From page :
1293
To page :
0
Abstract :
In this paper, an analog circuit fault diagnosis method using a noise measurement and analysis approach is suggested. Compared to the conventional circuit fault diagnosis methods, this method can discover hidden and early circuit fault caused by the device defects. Since circuit fault diagnosis is more difficult than device-defect detection, in this paper the circuit output noise calculation, the comparison between the normal and failure conditions and the circuit fault diagnosis method have been discussed. Finally, an example of an active filter circuit fault diagnosis hasA been given by using this method. © 1999 Elsevier Science Ltd. All rights reserved.
Keywords :
GaAs , Plastic packages , Thermo-mechanical , Thermal , Reliability , Chemical , CVD diamond
Journal title :
MICROELECTRONICS RELIABILITY
Serial Year :
1999
Journal title :
MICROELECTRONICS RELIABILITY
Record number :
13144
Link To Document :
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