Title of article :
Modification of scheduled data flow graph for on-line testability
Author/Authors :
Ismaeel، A.A. نويسنده , , Bhatnagar، R. نويسنده , , Mathew، R. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
-1472
From page :
1473
To page :
0
Abstract :
An approach to modify a given scheduled data flow graph (SDFG) for improving on-line testability olʹ a data path is presented. Each functional unit (FU) of a data path is tested at least once in a time frame called pass. The approach utilizes idle-time of FUs. A given SDFG is utilized to estimate the number of FUs and their idle periods in which certain operations, called idle-time operations, are scheduled. Modified SDFG is utilized by OLI].- FLJ allocation technique presented earlier that minimizes the testing time. Addition of idle-time operations improves the testability without affecting FUsʹ count. The technique yields promising results. (C) 1999 Elsevier Science Ltd. All rights reserved.
Keywords :
Power clectronics packaging , Theermal simulations , Miniaturisation , failure rate , Market analy-sis , Integration , environmental tests , Switched mode power supply , Converter
Journal title :
MICROELECTRONICS RELIABILITY
Serial Year :
1999
Journal title :
MICROELECTRONICS RELIABILITY
Record number :
13177
Link To Document :
بازگشت