• Title of article

    Modification of scheduled data flow graph for on-line testability

  • Author/Authors

    Ismaeel، A.A. نويسنده , , Bhatnagar، R. نويسنده , , Mathew، R. نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -1472
  • From page
    1473
  • To page
    0
  • Abstract
    An approach to modify a given scheduled data flow graph (SDFG) for improving on-line testability olʹ a data path is presented. Each functional unit (FU) of a data path is tested at least once in a time frame called pass. The approach utilizes idle-time of FUs. A given SDFG is utilized to estimate the number of FUs and their idle periods in which certain operations, called idle-time operations, are scheduled. Modified SDFG is utilized by OLI].- FLJ allocation technique presented earlier that minimizes the testing time. Addition of idle-time operations improves the testability without affecting FUsʹ count. The technique yields promising results. (C) 1999 Elsevier Science Ltd. All rights reserved.
  • Keywords
    Power clectronics packaging , Converter , Theermal simulations , failure rate , Miniaturisation , Switched mode power supply , environmental tests , Integration , Market analy-sis
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Serial Year
    1999
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Record number

    13178