Title of article
Modification of scheduled data flow graph for on-line testability
Author/Authors
Ismaeel، A.A. نويسنده , , Bhatnagar، R. نويسنده , , Mathew، R. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
-1472
From page
1473
To page
0
Abstract
An approach to modify a given scheduled data flow graph (SDFG) for improving on-line testability olʹ a data path is presented. Each functional unit (FU) of a data path is tested at least once in a time frame called pass. The approach utilizes idle-time of FUs. A given SDFG is utilized to estimate the number of FUs and their idle periods in which certain operations, called idle-time operations, are scheduled. Modified SDFG is utilized by OLI].- FLJ allocation technique presented earlier that minimizes the testing time. Addition of idle-time operations improves the testability without affecting FUsʹ count. The technique yields promising results. (C) 1999 Elsevier Science Ltd. All rights reserved.
Keywords
Power clectronics packaging , Converter , Theermal simulations , failure rate , Miniaturisation , Switched mode power supply , environmental tests , Integration , Market analy-sis
Journal title
MICROELECTRONICS RELIABILITY
Serial Year
1999
Journal title
MICROELECTRONICS RELIABILITY
Record number
13178
Link To Document