Title of article :
Relaxation of operational amplifier parameters after pulsed electron beam irradiation
Author/Authors :
Betty، C.A. نويسنده , , Girija، K.G. نويسنده , , Lal، R. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
-1484
From page :
1485
To page :
0
Abstract :
An approach to modify a given scheduled data flow graph (SDFG) for improving on-line testability olʹ a data path is presented. Each functional unit (FU) of a data path is tested at least once in a time frame called pass. The approach utilizes idle-time of FUs. A given SDFG is utilized to estimate the number of FUs and their idle periods in which certain operations, called idle-time operations, are scheduled. Modified SDFG is utilized by OLI].- FLJ allocation technique presented earlier that minimizes the testing time. Addition of idle-time operations improves the testability without affecting FUsʹ count. The technique yields promising results. (C) 1999 Elsevier Science Ltd. All rights reserved.
Keywords :
LINAC , Time dependent phenomena , Operational amplifiers , Relaxation , Pulsed irradiation
Journal title :
MICROELECTRONICS RELIABILITY
Serial Year :
1999
Journal title :
MICROELECTRONICS RELIABILITY
Record number :
13180
Link To Document :
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