Title of article :
Getting more out of X2T2O7 compounds with thortveitite structure: The bond-valence model
Author/Authors :
M.D. Alba، نويسنده , , A.I. Becerro، نويسنده , , P. Chain، نويسنده , , A. Escudero، نويسنده , , T. Gonzalez-Carrascosa، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
340
To page :
344
Abstract :
C-M2Si2O7 (M=RE and In) and crystals of composition X2T2O7 (T=P, As, Ge) with ionic radius of X less than 0.97 Å (X=Ni, Cd, Mg, Zn, Cu, Ca) are isostructural with the natural-occurring mineral thortveitite. In those compounds, the T–O bridging distance values vary considerably and there is no explanation to this fact in the literature. This paper will bring their structural characteristics out by the bond-valence model. It has been concluded that T–O bridging distance and mean T–O distance are linearly correlated to the total atomic valence of the bridging oxygen and the T atom (T=Si, P, As, Ge), respectively, and they are a function of the principal quantum number (n) in the valence shell of the atom T. Finally, we have applied successfully the model for the prediction of Ge–O distances of (In,A)2Ge2O7 (A=Fe,Y,Gd) compounds.
Keywords :
Bond-valence model , Silicate , Solid state
Journal title :
JOURNAL OF SOLID STATE CHEMISTRY
Serial Year :
2008
Journal title :
JOURNAL OF SOLID STATE CHEMISTRY
Record number :
1333073
Link To Document :
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