Title of article :
Helium and hydrogen trapping in W and Mo single-crystals irradiated by He ions
Author/Authors :
Nagata، نويسنده , , S. and Tsuchiya، نويسنده , , B. and Sugawara، نويسنده , , T. and Ohtsu، نويسنده , , N. and Shikama، نويسنده , , T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
4
From page :
1513
To page :
1516
Abstract :
Retention of He and accumulation of H in the near surface layer of W and Mo single-crystals were studied during and after the implantation of He ions with 2–10 keV at 295 and 820 K. The He retention was saturated at a concentration of a He/metal ratio of about 0.25, depending on the implantation temperature. Subsequent He implantation caused H accumulation in the He saturated layer, up to a maximum concentration about equal to that of He. The initial H uptake rate just after the He irradiation was comparable to the impingement rate of the H2 or H2O molecule at the crystal surface from the residual gas. For the He irradiation at 820 K, blisters and exfoliation with large sizes were observed on the crystal surface, where impurities other than H and He were also enriched.
Journal title :
Journal of Nuclear Materials
Serial Year :
2002
Journal title :
Journal of Nuclear Materials
Record number :
1356856
Link To Document :
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