Author/Authors :
Gonzلlez de Vicente، نويسنده , , S.M. and Uytdenhouwen، نويسنده , , I. and Coad، نويسنده , , J.P. and Van Renterghem، نويسنده , , W. and Van den Berghe، نويسنده , , S. and Van Oost، نويسنده , , G. and Massaut، نويسنده , , V.، نويسنده ,
Abstract :
In fusion devices, in the region next to high temperature plasma, material could be eroded from plasma-facing materials in one location and is transported to other, sometimes remote, locations throughout the device. These plasma-created materials are so-called mixed materials. Previous studies on JET samples have shown that compositional changes in the depth profiles of the mixed-material surfaces can be correlated to the operational history of the machine. SEM and detailed EDX analysis of CFC Be and T contaminated samples coming from the JET divertor (shutdown 2007) have been carried out in the SCKCEN hot cell facilities. The main aim of these measurements is to have a clear image of the erosion/deposition pattern in those samples for each element. The processes for material migration and the morphology of the deposits are discussed. XPS/AES measurements will also be carried out to understand the possible compound processes, mainly focussed on Be2C formations.
