Author/Authors :
Miller، نويسنده , , B.D. and Gan، نويسنده , , J. and Madden، نويسنده , , J. and Jue، نويسنده , , J.F. and Robinson، نويسنده , , A. and Keiser Jr.، نويسنده , , D.D.، نويسنده ,
Abstract :
Transmission electron microscopy (TEM), scanning electron microscopy (SEM), and focused ion beam (FIB) milling were performed on an irradiated U–10Mo monolithic fuel to understand its irradiation microstructure. This is the first reported TEM work of an irradiated fuel sample prepared using a FIB. Advantages and disadvantages of using the FIB to create TEM samples from this irradiated fuel will be presented along with some results from the work. Sample preparation techniques used to create SEM and FIB samples from the brittle irradiated monolithic sample will also be discussed.
