Title of article :
Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy
Author/Authors :
Dourdain، نويسنده , , S. and Deschanels، نويسنده , , X. and Toquer، نويسنده , , G. and Grygiel، نويسنده , , C. and Monnet، نويسنده , , I. and Pellet-Rostaing، نويسنده , , S. and Grandjean، نويسنده , , A.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
4
From page :
411
To page :
414
Abstract :
An innovative approach to investigate the effects of irradiation on mesoporous structure is proposed from the characterisation of thin mesoporous silica films by X-ray reflectivity measurements coupled with scanning electron microscopy observations. Two different geometries of mesoporous thin films were irradiated with Xe ion beam. A collapse or a complete destruction of the porous structure depending on the pristine pore structure and an increase of the porosity attributed to track formation are discussed.
Journal title :
Journal of Nuclear Materials
Serial Year :
2012
Journal title :
Journal of Nuclear Materials
Record number :
1361271
Link To Document :
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