Author/Authors :
Kodama، نويسنده , , H. and Oyaidzu، نويسنده , , M. and Yoshikawa، نويسنده , , A. and Kimura، نويسنده , , H. and Oya، نويسنده , , Y. U. Matsuyama، نويسنده , , M. and Sagara، نويسنده , , A. and Noda، نويسنده , , N. and Okuno، نويسنده , , K.، نويسنده ,
Abstract :
Helium irradiation effects on the retention of energetic deuterium implanted into the boron coating film were investigated by means of X-ray photoelectron spectroscopy (XPS) and thermal desorption spectroscopy (TDS). It was found, by XPS, that the B 1s peak was shifted to lower binding energy side by He+ ion irradiation and the FWHM was extended. These facts show that the some defects were introduced into the boron coating film by He+ ion irradiation. From TDS experiment, the deuterium retention, especially the amount of B–D terminal bond, increased by the pre-He+ ion irradiation. However, it decreased by the post-He+ ion irradiation. These experimental results indicate that the B–D terminal bond was mainly influenced by the He+ ion irradiation because the two neighbor B–D bonds have to dissociate simultaneously for the B–D–B bridge bond.
