Author/Authors :
Gao، نويسنده , , Yuan and Yang، نويسنده , , Tengfei and Xue، نويسنده , , Jianming and Yan، نويسنده , , Sha and Zhou، نويسنده , , Shengqiang and Wang، نويسنده , , Yugang and Kwok، نويسنده , , Dixon T.K. and Chu، نويسنده , , Paul K. and Zhang، نويسنده , , Yanwen، نويسنده ,
Abstract :
Magnetron sputtered Cu/W multilayer samples with individual layer thicknesses from 2.5 to 50 nm were irradiated by 50 keV He+ ions at ion fluences from 7 × 1020 to 6 × 1021 m−2 at room temperature. Evolution of the interfacial structure during irradiation is monitored by X-ray diffraction and cross-sectional transmission electron microscopy. Moreover, radiation responses on the individual layer thickness and He+ ion irradiation fluence are revealed. The highly morphological stability of the multilayered structure suggests that the interfacial structure and grain boundary can serve as sinks for radiation-induced defects.
