Author/Authors :
K.V. Mani Krishna، نويسنده , , K.V. and Srivastava، نويسنده , , Ninad D. and Dey، نويسنده , , G.K. and Hiwarkar، نويسنده , , V. and Samajdar، نويسنده , , I. and Saibaba، نويسنده , , N.، نويسنده ,
Abstract :
Various methods of Kearns “f” parameter evaluation were compared for their consistency and dependency on measurement cross section of the sample and variation in the microstructure across different cross sections. The study showed that, EBSD (Electron Back Scattered Diffraction) method is more consistent in comparison to X-ray based techniques for the “f” parameter determination especially in case of recrystallized microstructures.
