Title of article
Defects in tungsten responsible for molecular hydrogen isotope retention after exposure to low energy plasmas
Author/Authors
Causey، نويسنده , , R.A. and Doerner، نويسنده , , R. and Fraser، نويسنده , , H. and Kolasinski، نويسنده , , R.D. and Smugeresky، نويسنده , , J. and Umstadter، نويسنده , , K. and Williams، نويسنده , , R.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
4
From page
717
To page
720
Abstract
Recent work on hydrogen isotope retention in tungsten has shown a substantial fraction of the retained hydrogen to be in the form of molecules. It can be expected that hydrogen permeating through a material such as tungsten, that has a very low solubility for hydrogen, would come out of solution and combine into molecules at voids located throughout the bulk. The purpose of this report is to determine the type of voids responsible for the molecular retention. High purity tungsten provided by Plansee Aktiengesellschaft was first polished, annealed at 1273 K in vacuum for one hour, and then exposed to high fluxes and high fluences of deuterium in the PISCES facility. High resolution Transmission Electron Microscopy was then used to examine the samples for voids. The results of these experiments were used to interpret the expected behavior of tungsten to be used as the divertor of the ITER fusion device.
Journal title
Journal of Nuclear Materials
Serial Year
2009
Journal title
Journal of Nuclear Materials
Record number
1366012
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