Title of article :
Photoelectron spectroscopy study of PuCoGa5 thin films
Author/Authors :
Eloirdi، نويسنده , , R. and Havela، نويسنده , , L. and Gouder، نويسنده , , T. and Shick، نويسنده , , A. and Rebizant، نويسنده , , J. and Huber، نويسنده , , F. and Caciuffo، نويسنده , , R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
3
From page :
8
To page :
10
Abstract :
Thin layers of PuCoGax (x = 4 to 18) have been prepared by dc sputtering from a PuCoGa5 single crystal target, and investigated in situ by X-ray and ultraviolet photoelectron spectroscopy. We could achieve broad composition variability (monitored by the Pu-4f, Co-2p and Ga-2p core-level spectra). The results are compared to the valence band spectra reported previously for PuCoGa5. Our experiments reveal that some Ga excess (PuCoGa≈7) was likely for those original data. We demonstrate that there is a tendency to the segregation of Ga at the surface, which has an important effect on the valence band spectra.
Journal title :
Journal of Nuclear Materials
Serial Year :
2009
Journal title :
Journal of Nuclear Materials
Record number :
1366723
Link To Document :
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