Title of article :
Defect generation in low-energy ion-assisted thermal deposited lithium fluoride films
Author/Authors :
Cricenti، نويسنده , , A. and Montereali، نويسنده , , R.M. and Mussi، نويسنده , , V. and Nichelatti، نويسنده , , E. and Pilloni، نويسنده , , L. and Scaglione، نويسنده , , S. and Somma، نويسنده , , F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
111
To page :
116
Abstract :
We present first results concerning stable formation of primary electronic defects and lithium nanometer sized clusters in LiF thin films grown by ion-assisted thermal deposition. The optical and morphological properties of the as grown LiF films, dependent on the deposition conditions, such as ion-beam energy and ion species (Xe, Ar), are reported. The experimental results show a larger efficiency of low-energy Xe ions in inducing the formation of lithium nano-clusters. To analyse the role of the deposition conditions, a preliminary interpretation of the lithium nano-cluster formation mechanism based on the spherical and/or cylindrical spike thermal model is given.
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2003
Journal title :
Journal of Non-Crystalline Solids
Record number :
1368522
Link To Document :
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