Distribution of electronic states in amorphous Cd–As thin films on the basis of optical measurements

Transmission and fundamental reflectivity studies, completed on amorphous Cd–As thin films, allowed us to obtain parameters describing the fundamental absorption edge, i.e. the optical pseudogap EGopt, Urbach energy EU and exponential edge parameter ET. All these data, together with the results of earlier transport measurements, have been utilized in developing simple models of electronic structure (distribution of electronic states) for amorphous Cd–As thin films of various compositions.