Title of article
Atomic scale imaging of amorphous silicate glass surfaces by scanning force microscopy
Author/Authors
Raberg، نويسنده , , W. and Ostadrahimi، نويسنده , , A.H. and Kayser، نويسنده , , T. and Wandelt، نويسنده , , K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
8
From page
1089
To page
1096
Abstract
The determination of the atomic structure of amorphous materials with conventional diffraction techniques is hindered by the missing periodicity of the samples. Consequently, a deeper insight into the structural properties of glasses can only be obtained in real space. In this work AFM investigations of silicate glass surfaces, namely fresh barium silicate and silica glass fracture surfaces, are described. The observed atomic-scale features and arrangements are compared with each other as well as with results from other methods and discussed in the context of classical glass structure theories. The results clearly demonstrate that AFM is able to provide atomically resolved surface structures of amorphous glass surfaces.
Journal title
Journal of Non-Crystalline Solids
Serial Year
2005
Journal title
Journal of Non-Crystalline Solids
Record number
1370152
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