Author/Authors :
Tiwari، نويسنده , , M.K. and Modi، نويسنده , , M.H. and Lodha، نويسنده , , G.S. and Sinha، نويسنده , , A.K. and Sawhney، نويسنده , , K.J.S. and Nandedkar، نويسنده , , R.V.، نويسنده ,
Abstract :
In the present study we have carried out non-destructive surface characterization of a float glass using total reflection X-ray fluorescence (TXRF) technique and X-ray reflectivity (XRR). The in-depth distribution of Sn and Fe impurities has been determined by TXRF where as X-ray optical properties such as r.m.s surface roughness, refractive index, etc., have been derived by XRR. The results obtained so are used in analyzing the soft X-ray optical constants in the wavelength region of 80–200 Å. The results obtained indicate that two surfaces of float glass differ significantly.
