Title of article :
Structurally characterised silyls
Author/Authors :
Robert A. Gossage، نويسنده ,
Issue Information :
دوفصلنامه با شماره پیاپی سال 2000
Pages :
8
From page :
164
To page :
171
Abstract :
This review summarises the inorganic and organic compounds containing the silyl (i.e. SiH3) fragment that have been characterised by single-crystal X-ray diffraction in the solid-state. Relevant features of these silicon-containing materials are compared and contrasted.
Keywords :
Silyl , Solid-state , X-ray crystal structure , Silicon , Organosilane , Silane
Journal title :
Journal of Organometallic Chemistry
Serial Year :
2000
Journal title :
Journal of Organometallic Chemistry
Record number :
1370976
Link To Document :
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