Title of article :
On the correlation between void-species structure of vitreous arsenic selenide studied with X-ray diffraction and positron annihilation techniques
Author/Authors :
Shpotyuk، نويسنده , , O. and Kozdras، نويسنده , , A. and Kavetskyy، نويسنده , , T. and Filipecki، نويسنده , , J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
4
From page :
700
To page :
703
Abstract :
The structure of nanoscale void-species has been studied in glassy arsenic selenide g-As2Se3 by combining the first sharp diffraction peak in X-ray diffraction (FSDP-related XRD), treated within Elliott’s void-based model, and positron annihilation lifetime spectroscopy (PALS) within two-state positron trapping model. By suggesting that the same nanovoids are responsible for both FSDP and PALS data, the analytical correlation relationship between the FSDP position, Q1, and nanovoid diameter, D, has been presented in the form of Q1 = 2.3 · π/D.
Keywords :
X-ray diffraction , chalcogenides , long-range order , Medium-range order , Short-range order
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2006
Journal title :
Journal of Non-Crystalline Solids
Record number :
1372147
Link To Document :
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