Title of article :
Spectrometric and ellipsometric studies of (1 − x)TiO2 · xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb) thin films
Author/Authors :
Kranjcec، نويسنده , , M. and Studenyak، نويسنده , , I.P. and Nahusko، نويسنده , , O.T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
Spectrometric and ellipsometric studies of (1 − x)TiO2 · xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb; x = 0.33, 0.5) thin films at room temperature were performed. The obtained dispersion dependences of refractive indices are successfully described by the optical-refractometric relation. The dependence of optical pseudogap and refractive indices on composition and molar mass of the films is investigated. The influence of compositional disordering on the energy width of the exponential absorption edge is studied.
Keywords :
Films and coatings , optical spectroscopy , ellipsometry
Journal title :
Journal of Non-Crystalline Solids
Journal title :
Journal of Non-Crystalline Solids