Title of article :
New insight into phase change memories
Author/Authors :
Marian N. Velea، نويسنده , , Alin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
6
From page :
2626
To page :
2631
Abstract :
The switching mechanism in phase change memories was described on the basis of minimum switching unit: the commuton. A commuton is a minimum cluster of atoms that supports a reversible phase change from high to low electrical conduction state and back under the influence of an external signal. The switching process in a phase change chalcogenide film was modeled using two dimensional cellular automata approach. A system of 50 × 50 cells, each cell containing a commuton, was simulated. In the particular case of Ge2Sb2Te5 (investigated here) this system corresponds to a 30 × 30 nm area. The formation of the percolation path as a function of phase change induced in commutons explains the switching phenomenon. The influence of the percent of defects in the material on the percolation threshold has been studied.
Keywords :
Percolation , Phase change materials , switching , Cellular automata
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2011
Journal title :
Journal of Non-Crystalline Solids
Record number :
1381581
Link To Document :
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