Title of article :
Structural study of (As2S3)0.6(GeS2)0.4 glass
Author/Authors :
Kavetskyy، نويسنده , , T. and Shpotyuk، نويسنده , , O. and Kaban، نويسنده , , I. and Hoyer، نويسنده , , W. and Filipecki، نويسنده , , J. and Iovu، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
(As2S3)0.6(GeS2)0.4 glass in non-irradiated and γ-irradiated states has been studied by using high-energy synchrotron X-ray diffraction, extended X-ray absorption fine structure spectroscopy, and positron annihilation lifetime spectroscopy. The experimental results are explained by the local changes around As and Ge atoms upon irradiation. These changes are suggested to involve chemical bonds distortion, formation of defective bonds with wrong coordination, rotation of structural units and appearance of additional free volume in the glass network.
Keywords :
Synchrotron radiation , X-ray diffraction , Infrared glasses , chalcogenides , radiation , Defects , Medium-range order , Short-range order , Positron annihilation , First sharp diffraction peak , Radiation effects
Journal title :
Journal of Non-Crystalline Solids
Journal title :
Journal of Non-Crystalline Solids