Title of article :
Water diffusion in silica film during silicon wet oxidation
Author/Authors :
Lee، نويسنده , , J.-W. and Tomozawa، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
7
From page :
4633
To page :
4639
Abstract :
Water diffusion in silica glass is explained in terms of the migration of molecular water and its reaction with the silica network to form immobile hydroxyl water. It is assumed that the reaction is fast at high temperatures, and a local reaction equilibrium is maintained during water diffusion. While this mechanism appears to explain water diffusion in silica glasses determined from hydroxyl profiles reasonably well, we found that water diffusion-promoted phenomena, such as the oxidation of silicon, require a small quantity of molecular water diffusing into silica glasses ahead of the hydroxyl diffusion front, unrestricted by the local equilibrium. This was demonstrated by studying oxidation kinetics of silicon with a thick (∼15 μm) oxide layer and measuring the delay time before the steady-state oxidation.
Keywords :
Silicon , Oxidation , Diffusion and transport , Glasses , optical spectroscopy , FTIR measurements , silica , Water in glass , Films and coatings
Journal title :
Journal of Non-Crystalline Solids
Serial Year :
2007
Journal title :
Journal of Non-Crystalline Solids
Record number :
1382467
Link To Document :
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